Electron Microscopy
Contact: Xingzhong "Jim" LiLocation: Jorgensen Hall 033
E-mail: xli2@unl.edu
Phone: (402) 472-8762
URL: http://www.unl.edu/ncmn/cfem
The function of the Electron Microscopy facility is to provide access to electron microscopes, sample preparation equipment and data collection and data instrumentation. The scope of the facility is materials characterization of the topography, morphology, elemental composition, crystalline structure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.
| Make | Model | Equipment Function |
|---|---|---|
| Allied | Multiprep | Precise semi-automatic sample preparation equipment |
| Branson | 2200 | Ultrasonic Cleaner |
| Emscope | SC500 | Sputter Coater |
| FEI | Nova Nano SEM450 | Scanning Electron Microscope |
| FEI | Osiris (S)TEM | (Scanning) Transmission Electron Microscope |
| Gatan | PIPS | Precision Ion Polishing System |
| Intek | ISMB4003 | Optical Microscope |
| JEOL | JEM 2010 | Transmission Electron Microscope |
| JEOL | JSM 840A | Scanning Electron Microscope |
| Leica | Zoom 2000 | Stereo Microscope |
| VCR Group | D500i | Dimpler |
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